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EXIS Key Measurement Requirements Chart

Parameter Requirement Design
XRS λ Range 0.05 nm — 0.8 nm 0.05 nm — 0.8 nm
XRS Dynamic Range 10-9 W/m2 — 10-3 W/m2 10-9 W/m2 — 10-3 W/m2
XRS SNR 1:1 over 10 min. average ≻30:1 over 10 min. average
XRS Data Product Accuracy ≤20% over mission life 14% over mission life
XRS Cadence ≤3 s 1 s
EUVS λ Range 5 - 127 nm 5 -127 nm (data product)
EUVS Δ λ Resolution From 5 to 35 nm : 10 nm bins
From 35 to 115 nm : 40 nm bins
L-α (121.6 nm) : 10 nm (FWHM)
5 — 115 nm; 5 nm bins
117 — 127; 10 nm bins
EUVS SNR 1:1 over 10 min average ≻20:1 over 10 min average
EUVS Data Product Accuracy ≤20% over mission life 18% over mission life
EUVS Cadence ≤30 s ≤10 s
EUVS Measurements solar lines at 25.6, 28.4, 30.4, 117.5, 121.6, 133.5, 140.5 nm; Mg II index